Title :
Proceedings of 1994 IEEE International SOI Conference
Abstract :
The following topics were dealt with: device modeling and physics; materials processing; materials characterization; circuits and applications; device processing and characterization
Keywords :
CMOS integrated circuits; MOSFET; SIMOX; semiconductor device models; semiconductor technology; silicon-on-insulator; CMOS; MOSFET; SIMOX; SOI; device characterization; device modeling; device physics; device processing; integrated circuits; materials characterization; materials processing;
Conference_Titel :
SOI Conference, 1994 Proceedings., 1994 IEEE International
Conference_Location :
Nantucket, MA, USA
Print_ISBN :
0-7803-2406-4
DOI :
10.1109/SOI.1994.514199
