• DocumentCode
    2351395
  • Title

    Implementation of a “perfect launch” process to improve the effectiveness of automotive new product ramps

  • Author

    Hempleman, Gary L.

  • Author_Institution
    Harris Semicond., Findlay, OH, USA
  • fYear
    1998
  • fDate
    19-21 Oct 1998
  • Firstpage
    46
  • Lastpage
    49
  • Abstract
    Automotive new product ramps demand that product-to-market times are shorter than ever to face the ongoing competitive challenges of the future. Implementation of a “perfect launch” process is a key factor driving the continuous improvement process aimed at providing parts meeting all customer requirements with zero anomalies. The QS-9000 Production Part Approval Process for General Motors requires an Early Production Containment (GP-12) procedure, “to document the supplier´s effort to gain control of its processes during start-up and acceleration, so that any quality issues that may arise are quickly identified and corrected at the supplier´s location and not at the GM customer´s manufacturing location”. Our process at Harris Semiconductor expands this concept to Ford and Chrysler (beyond QS-9000 requirements) to optimize our systems effectiveness aimed at the elimination of all returns and failures
  • Keywords
    automotive electronics; electronic equipment manufacture; optimisation; process control; product development; quality control; standards; Chrysler; Early Production Containment GP-12 procedure; Ford; GM QS-9000 Production Part Approval Process; General Motors; automotive new product ramp; competitiveness; component supplier location; continuous improvement process; customer requirements; failures elimination; manufacturing location; perfect launch process implementation; process acceleration; process control; process start-up; product-to-market time; quality issues; returns elimination; systems effectiveness optimization; Acceleration; Assembly; Automotive engineering; Continuous improvement; Error correction; Gain control; Inspection; Manufacturing; Manufacturing processes; Process control; Production; Semiconductor device manufacture; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1998. Twenty-Third IEEE/CPMT
  • Conference_Location
    Austin, TX
  • ISSN
    1089-8190
  • Print_ISBN
    0-7803-4523-1
  • Type

    conf

  • DOI
    10.1109/IEMT.1998.731018
  • Filename
    731018