• DocumentCode
    235176
  • Title

    Hygro-thermo-mechanical analysis and failure prediction in electronic packages by using peridynamics

  • Author

    Oterkus, Selda ; Madenci, Erdogan ; Oterkus, Erkan ; Yuchul Hwang ; Jangyong Bae ; Sungwon Han

  • Author_Institution
    Univ. of Arizona, Tucson, AZ, USA
  • fYear
    2014
  • fDate
    27-30 May 2014
  • Firstpage
    973
  • Lastpage
    982
  • Abstract
    This study presents an integrated approach for the simulation of hygro-thermo-vapor-deformation analysis of electronic packages by using peridynamics. This theory is suitable for such analysis because of its mathematical structure. Its governing equation is an integro-differential equation and it is valid regardless of the existence of material and geometric discontinuities in the structure. It permits the specification of distinct properties of interfaces between dissimilar materials in the direct modeling of thermal and moisture diffusion, and deformation. Therefore, it enables progressive damage analysis in materials or layered material systems such as the electronic packages. It describes the validation procedure by considering a particular package for each thermomechanical, hygromechanical deformation as well as vapor pressure predictions. Also, it presents results concerning failure sites and mechanisms due to hygro-thermo-vapor-deformation.
  • Keywords
    deformation; failure analysis; integrated circuit packaging; integrated circuit reliability; moisture; thermal analysis; electronic package; failure prediction; geometric discontinuities; hygromechanical deformation; hygrothermo vapor deformation analysis; hygrothermomechanical analysis; peridynamic theory; progressive damage analysis; thermomechanical deformation; vapor pressure prediction; Equations; Integrated circuits; Materials; Mathematical model; Moisture; Strain; Thermomechanical processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
  • Conference_Location
    Orlando, FL
  • Type

    conf

  • DOI
    10.1109/ECTC.2014.6897407
  • Filename
    6897407