DocumentCode
235198
Title
Modeling, design, and demonstration of ultra-miniaturized and high efficiency 3D glass photonic modules
Author
Chou, Bruce C. ; Razdan, Sandeep ; HaiPeng Zhang ; Jibin Sun ; Bowen, Terry ; Smet, Vanessa ; Gee-Kung Chang ; Sundaram, Venky ; Tummala, Rao
Author_Institution
3D Syst. Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
fYear
2014
fDate
27-30 May 2014
Firstpage
1054
Lastpage
1059
Abstract
This paper presents the modeling, design, and demonstration of an ultra-miniaturized 2.5D optical transceiver module using ultra-thin glass interposers with electrical and optical through vias. The 3D Glass Photonics (3DGP) technology with double sided attach of electrical and photonics ICs can achieve ultra-high bandwidth with improved power efficiency at lower cost than other photonic integration such as silicon photonics and organic boards. Thin glass substrates with 60um diameter through vias were fabricated with copper plated electrical vias and polymer-filled optical vias, formed simultaneously. Re-distribution layers were fabricated on top of these integrated vias for electrical interconnections. The 2.5D optical module produced this way features flip-chip bonded VCSEL and driver chips. Initial measurements of the optical vias showed 1.2 dB of loss.
Keywords
copper; elemental semiconductors; flip-chip devices; integrated optics; optical transceivers; silicon; 2.5D optical transceiver module; 3D glass photonic modules; Cu; IC; Si; copper plated electrical vias; driver chips; electrical interconnections; electrical through vias; flip-chip bonded VCSEL; optical through vias; organic boards; photonic integration; polymer-filled optical vias; silicon photonics; size 60 mum; thin glass substrates; ultra-thin glass interposers; Glass; Integrated optics; Optical device fabrication; Optical fibers; Optical losses; Optical refraction; 2.5 D glass interposer; optical transceiver; optical vias;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
Conference_Location
Orlando, FL
Type
conf
DOI
10.1109/ECTC.2014.6897418
Filename
6897418
Link To Document