• DocumentCode
    2352315
  • Title

    Detection of manufacturing defects in polymeric cable joint insulation using X-rays

  • Author

    Robinson, Adrian P. ; Lewin, Paul L. ; Swingler, Stephen G.

  • Author_Institution
    Tony Davies High Voltage Lab., Southampton Univ.
  • fYear
    2006
  • fDate
    11-14 June 2006
  • Firstpage
    34
  • Lastpage
    37
  • Abstract
    Defects can be accidentally introduced into the insulation system of cable joints during manufacture, due to the manual nature of the jointing process. Any defect introduced can have an affect on the working lifetime of the cable, therefore, it is necessary to detect and remove these defects. Detection of defects can be achieved by using conventional X-ray techniques, however, there are problems with this method of joint inspection that are associated with the development, inspection and storage of the photographic film. These problems have been removed by the conversion to a digital CCD array X-ray camera. The digital images produced using the camera can be inspected for inclusions and voids using the changes in the pixel intensity distributions caused by such a defect. The result of this inspection is a binary image of the defects found. This image can then be superimposed back onto the original image in order to locate the defects found
  • Keywords
    CCD image sensors; X-ray imaging; cable jointing; inclusions; inspection; insulation testing; organic insulating materials; polymers; power cable insulation; power cable testing; video cameras; voids (solid); digital CCD array X-ray camera; digital image; inclusion; inspection; jointing process; manufacturing defect detection; photographic film storage; pixel intensity distribution; polymeric cable joint insulation; void; Cable insulation; Charge coupled devices; Digital cameras; Image converters; Inspection; Manufacturing processes; Plastic insulation; Polymers; X-ray detection; X-ray detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 2006. Conference Record of the 2006 IEEE International Symposium on
  • Conference_Location
    Toronto, Ont.
  • ISSN
    1089-084X
  • Print_ISBN
    1-4244-0333-2
  • Type

    conf

  • DOI
    10.1109/ELINSL.2006.1665251
  • Filename
    1665251