DocumentCode
2352683
Title
An efficient method for improving the quality of per-test fault diagnosis
Author
Liu, Chunsheng
Author_Institution
Dept. of Comput. & Electron. Eng., Nebraska-Lincoln Univ., Omaha, NE, USA
fYear
2004
fDate
7-11 Nov. 2004
Firstpage
648
Lastpage
651
Abstract
Per-test fault diagnosis methodology has been shown to be an effective one for the identification of complex defects. We improve a recent per-test technique by applying additional diagnosis on the outputs of the circuit. The new method brings in more evidence to support the true failures, hence improves the diagnostic quality. We show that this method can very well address several problems in previous work.
Keywords
fault diagnosis; integrated circuit testing; logic testing; diagnostic quality; fault testing methods; integrated circuit testing; per-test fault diagnosis; Algorithm design and analysis; Circuit faults; Circuit testing; Failure analysis; Fault diagnosis; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Aided Design, 2004. ICCAD-2004. IEEE/ACM International Conference on
ISSN
1092-3152
Print_ISBN
0-7803-8702-3
Type
conf
DOI
10.1109/ICCAD.2004.1382655
Filename
1382655
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