• DocumentCode
    2352841
  • Title

    Implications of EPA´s Risk Management Program to semiconductor manufacturers

  • Author

    Davis, Brett Jay ; Nauert, Christopher

  • Author_Institution
    Motorola Inc., Austin, TX, USA
  • fYear
    1998
  • fDate
    19-21 Oct 1998
  • Firstpage
    296
  • Lastpage
    307
  • Abstract
    The US EPA´s Risk Management Program (RMP) requires consequences analyses of accidental releases, independent of the probability of release, for a list of toxic and flammable substances. The General Duty Clause (GDC) of the RMP expands the analyses to all hazardous substances with potential for offsite consequences. RMP applies to numerous existing and proposed semiconductor manufacturing processes. The RMP process begins with creation of a facility-wide chemical inventory. All applicable processes and other processes with potential off-site impacts then undergo toxicological consequence analysis of off-site health effects from catastrophic release using dispersion modeling. An off-site consequences analysis identifies the hazard or impact zone which is defined as the circular area centered at the point of the release where modeled impacts exceed the toxic or flammable endpoint. For each process, the impact zone and locations of human and sensitive environmental receptors are plotted. These plots are used to make consequences based risk management decisions regarding the types, concentrations and quantities of chemicals used; handling, distribution and release notification and response procedures and systems; and the location of storage relative to offsite and onsite receptors. The potential for adverse public relations related to the perception of poor risk management also enters into these decisions. For future bulk toxic and flammable chemicals systems in the semiconductor industry, an RMP analysis should be performed prior to installation
  • Keywords
    chemical technology; combustion; environmental factors; health hazards; integrated circuit manufacture; materials handling; planning; pollution; risk management; safety; RMP General Duty Clause; RMP analysis; RMP process; US EPA Risk Management Program; accidental hazardous substance release; bulk flammable chemicals systems; bulk toxic chemicals systems; catastrophic release; chemical concentrations; chemical distribution; chemical handling; chemical quantities; chemical release notification; chemical storage location; chemical types; consequences analyses; consequences based risk management decisions; dispersion modeling; facility-wide chemical inventory; flammable endpoint; flammable substances; hazard zone; hazardous substances; human receptors; impact zone; installation; modeled impacts; off-site consequences analysis; off-site health effects; off-site impact; offsite consequences; offsite receptors; onsite receptors; public relations; response procedures; response systems; risk management; semiconductor industry; semiconductor manufacturers; semiconductor manufacturing processes; sensitive environmental receptors; toxic endpoint; toxic substances; toxicological consequence analysis; Chemical analysis; Chemical hazards; Chemical processes; Dispersion; Flammability; Humans; Manufacturing processes; Risk analysis; Risk management; Toxicology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1998. Twenty-Third IEEE/CPMT
  • Conference_Location
    Austin, TX
  • ISSN
    1089-8190
  • Print_ISBN
    0-7803-4523-1
  • Type

    conf

  • DOI
    10.1109/IEMT.1998.731086
  • Filename
    731086