Title :
High frequency lumped element models for substrate noise coupling
Author :
Xu, Chenggang ; Fiez, Terri ; Mayaram, Karti
Author_Institution :
Sch. of EECS, Oregon State Univ., Corvallis, OR, USA
Abstract :
Lumped element models for the frequency dependence of substrate parasitics in integrated circuits are evaluated. The frequency ranges for which these models are applicable have been identified. Two new models that are suitable for very high frequencies are also presented.
Keywords :
circuit simulation; coupled circuits; integrated circuit modelling; integrated circuit noise; substrates; high frequency lumped element models; integrated circuits; substrate noise coupling; substrate parasitics frequency dependence; Admittance; Circuit noise; Conductivity; Coupling circuits; Dielectric losses; Dielectric substrates; Equivalent circuits; Frequency dependence; Integrated circuit modeling; Integrated circuit noise;
Conference_Titel :
Behavioral Modeling and Simulation, 2003. BMAS 2003. Proceedings of the 2003 International Workshop on
Print_ISBN :
0-7803-8135-1
DOI :
10.1109/BMAS.2003.1249856
