Title :
Evaluation of distribution fault diagnosis algorithms using ROC curves
Author :
Cai, Yixin ; Chow, Mo-Yuen ; Lu, Wenbin ; Li, Lexin
Author_Institution :
Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
Abstract :
In power distribution fault data, the percentage of faults with different causes could be very different and varies from region to region. This data imbalance issue seriously affects the performance evaluation of fault diagnosis algorithms. Due to the limitations of conventional accuracy (ACC) and geometric mean (G-mean) measures, this paper discusses the application of Receiver Operating Characteristic (ROC) curves in evaluating distribution fault diagnosis performance. After introducing how to obtain ROC curves, Artificial Neural Networks (ANN), Logistic Regression (LR), Support Vector Machines (SVM), Artificial Immune Recognition Systems (AIRS), and K-Nearest Neighbor (KNN) algorithm are compared using ROC curves and Area Under the Curve (AUC) on real-world fault datasets from Progress Energy Carolinas. Experimental results show that AIRS performs best most of the time and ANN is potentially a good algorithm with a proper decision threshold.
Keywords :
artificial immune systems; fault diagnosis; neural nets; power distribution faults; regression analysis; sensitivity analysis; support vector machines; K-nearest neighbor algorithm; ROC curves; area under the curve; artificial immune recognition systems; artificial neural networks; data imbalance; geometric mean measures; logistic regression; performance evaluation; power distribution fault diagnosis algorithms; progress energy carolinas; real-world fault datasets; receiver operating characteristic curve; support vector machines; ROC curves; artificial immune recognition systems; artificial neural networks; classification; fault cause identification; k-nearest neighbor algorithm; logistic regression; power distribution systems; support vector machine;
Conference_Titel :
Power and Energy Society General Meeting, 2010 IEEE
Conference_Location :
Minneapolis, MN
Print_ISBN :
978-1-4244-6549-1
Electronic_ISBN :
1944-9925
DOI :
10.1109/PES.2010.5588154