• DocumentCode
    2353350
  • Title

    Discrete state space fitting algorithm for digitally recorded impulse parameter evaluation

  • Author

    Kuan, Jen-Tsan ; Chen, Mu-Kuen

  • Author_Institution
    Dept. of Electr. Eng., St. John´´s Univ., Taipei
  • fYear
    2006
  • fDate
    11-14 June 2006
  • Firstpage
    265
  • Lastpage
    268
  • Abstract
    Lightning impulse tests are performed on power apparatus to assess its insulation integrity when exposed to over voltage of atmospheric origin. For the evaluation of the test results it is imperative to determine the impulse parameters according to the standards. For the parameter evaluation of the digitally recorded impulse, the eigensystem realization algorithm (ERA) which produces a discrete state space model has been applied to the impulse curve fitting. With appropriate system order, the dynamic state space model is suitable for all types of impulse waveforms. Transforming the identified discrete state space model to the modal coordinates, it is possible to extract the oscillation or overshoot components from the original waveform in analytic function with high accuracy. Depending on the identified oscillation frequency or overshoot duration, the unwanted components can be removed for the construction of the mean curve without significant distortions in the original waveform. This paper demonstrates that ERA is a potentially valuable analytical tool for the evaluation of the impulse parameters
  • Keywords
    curve fitting; eigenvalues and eigenfunctions; insulation testing; lightning; power apparatus; state-space methods; curve fitting; digital recording; discrete state space model; eigensystem realization algorithm; insulation assessment; lightning impulse test; parameter evaluation; power apparatus; Curve fitting; Eigenvalues and eigenfunctions; Frequency; Impulse testing; Insulation testing; Lightning; Mathematical model; State-space methods; Switches; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 2006. Conference Record of the 2006 IEEE International Symposium on
  • Conference_Location
    Toronto, Ont.
  • ISSN
    1089-084X
  • Print_ISBN
    1-4244-0333-2
  • Type

    conf

  • DOI
    10.1109/ELINSL.2006.1665308
  • Filename
    1665308