Title :
High performance CMOS compatible bistable operation at extremely low supply voltage by a novel Si interband tunneling diode
Author :
Morita, K. ; Sorada, H. ; Morimoto, K. ; Yuki, K. ; Yoshii, S. ; Niwa, M. ; Uenoyama, T. ; Ohnaka, K.
Author_Institution :
Central Res. Labs., Matsushita Electr. Ind. Co. Ltd., Osaka, Japan
Abstract :
The supply voltage of Si ULSIs must be reduced below 0.5 V, the lower limit for conventional CMOS, in order to suppress power consumption. A quantum effect device is one of the most promising candidates to overcome this problem. However, few devices have been proposed to achieve CMOS compatible bistable operation (i.e. maximum output voltage is equal to supply voltage) below 0.5 V at room temperature using Si. The purpose of this work is to realise CMOS compatible bistable operation below 0.5 V at room temperature by means of a novel interband tunneling diode using Si materials, and to demonstrate the possibilities of such a device for multistate memory.
Keywords :
CMOS digital integrated circuits; elemental semiconductors; integrated memory circuits; silicon; tunnel diodes; 0.5 V; 20 C; CMOS compatible bistable operation; CMOS supply voltage; Si; Si ULSIs; Si interband tunneling diode; Si materials; interband tunneling diode; maximum output voltage; multistate memory; power consumption; quantum effect device; room temperature operation; supply voltage; Low voltage;
Conference_Titel :
Device Research Conference Digest, 1998. 56th Annual
Conference_Location :
Charlottesville, VA, USA
Print_ISBN :
0-7803-4995-4
DOI :
10.1109/DRC.1998.731113