DocumentCode :
235368
Title :
Plasma-based die singulation processing technology
Author :
Mackenzie, Kenneth D. ; Pays-Volard, David ; Martinez, Luis ; Johnson, Chris ; Lazerand, Thierry ; Westerman, Russell
Author_Institution :
Plasma-Therm LLC, St. Petersburg, FL, USA
fYear :
2014
fDate :
27-30 May 2014
Firstpage :
1577
Lastpage :
1583
Abstract :
In support of improved productivity for the semiconductor and optoelectronics manufacturing industry, new work is presented on the development of a plasma-based die singulation process technique for thin Si wafers. It is shown that the technique leads to a significant gain in productivity through reduced process times and increased available good die per wafer. Some additional related key benefits are increased yield, die strength, and the potential of nonorthogonal die.
Keywords :
elemental semiconductors; microassembling; optoelectronic devices; semiconductor device manufacture; semiconductor industry; silicon; wafer level packaging; nonorthogonal die; optoelectronics manufacturing industry; plasma-based die singulation processing technology; semiconductor manufacturing industry; thin Si wafers; Laser beams; Plasmas; Productivity; Semiconductor lasers; Silicon; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
Conference_Location :
Orlando, FL
Type :
conf
DOI :
10.1109/ECTC.2014.6897504
Filename :
6897504
Link To Document :
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