• DocumentCode
    2353690
  • Title

    Formimg local semi-insulating regions on silicon wafers by proton bombardment

  • Author

    Liao, C. ; Huang, T.-H. ; Lee, C.-Y. ; Tang, D.-L. ; Lan, S.-M. ; Yang, T.-N. ; Lin, L.-F.

  • Author_Institution
    Electron. Res. Service Organ., Ind. Technol. Res. Inst., Hsinchu, Taiwan
  • fYear
    1998
  • fDate
    22-24 June 1998
  • Firstpage
    80
  • Lastpage
    81
  • Abstract
    High-resistivity silicon substrates are desirable for mixed-mode and RF integrated circuits, as it damps the substrate noise in the former and provides high Q-factor inductors and low-loss resonators in the latter. Unlike GaAs, semi-insulating silicon substrates are very hard to obtain. This paper demonstrates a low-cost method that creates local semi-insulating regions in typical silicon wafers with substrate resistivity of around 10 /spl Omega/-cm. We show that local semi-insulating substrates can be formed by MeV proton bombardment of silicon wafers. The M/spl Omega/-cm resistivity substrate is ideal for RF applications and mixed mode IC applications.
  • Keywords
    electrical resistivity; elemental semiconductors; integrated circuit technology; microwave integrated circuits; mixed analogue-digital integrated circuits; proton effects; silicon; surface treatment; 10 ohmcm; Q-factor; RF integrated circuits; Si; high-resistivity silicon substrates; inductors; local semi-insulating region formation; local semi-insulating regions; local semi-insulating substrates; low-loss resonators; mixed mode IC applications; mixed-mode integrated circuits; proton bombardment; resistivity; semi-insulating silicon substrates; silicon wafers; substrate noise; substrate resistivity; Application specific integrated circuits; Conductivity; Gallium arsenide; Inductors; Integrated circuit noise; Protons; Q factor; Radio frequency; Radiofrequency integrated circuits; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference Digest, 1998. 56th Annual
  • Conference_Location
    Charlottesville, VA, USA
  • Print_ISBN
    0-7803-4995-4
  • Type

    conf

  • DOI
    10.1109/DRC.1998.731130
  • Filename
    731130