Title :
Picosecond shock wave generation using an all-silicon nonlinear transmission line
Author :
Birk, M. ; Kibbel, H. ; Warns, C. ; Trasser, A. ; Schumacher, H.
Author_Institution :
Dept. of Electron Devices & Circuits, Ulm Univ., Germany
Abstract :
Nonlinear transmission lines (NLTL) use the voltage-dependent reverse-biased capacitance of Schottky diodes distributed along a high impedance transmission line to introduce nonlinear wave propagation effects. The shockwave NLTL, as described in this paper, steepens the leading or falling edge of a large time-domain signal, just like the wave-breaking effect of water on beaches. While traditionally NLTLs were monolithically integrated on GaAs, with the best reported results being the generation of 480 fs and 680 fs transients, we integrate these lines on high resistivity silicon. The advantages include the combination of silicon millimeter wave integrated circuits (SIMMWIC) with the nonlinear transmission line for high frequency applications, such as sampling circuits or high-order frequency multiplication. Integration with Si-SiGe heterostructure bipolar transistors for frequencies above 30 GHz yields new design alternatives.
Keywords :
Schottky diodes; bipolar MIMIC; coplanar waveguides; elemental semiconductors; frequency multipliers; heterojunction bipolar transistors; high-frequency transmission lines; millimetre wave frequency convertors; shock waves; silicon; 30 GHz; 480 fs; 680 fs; NLTL; Schottky diodes; Si; Si-SiGe; Si-SiGe heterostructure bipolar transistors; all-silicon nonlinear transmission line; frequency multiplication; high frequency applications; high resistivity silicon line integration; monolithically integrated NLTLs; nonlinear transmission lines; nonlinear wave propagation effects; sampling circuits; shock wave generation; shockwave NLTL; silicon millimeter wave integrated circuits; time-domain signal; transient generation; transmission line impedance; voltage-dependent reverse-biased capacitance; wave-breaking effect; Capacitance; Frequency; Impedance; Nonlinear wave propagation; Schottky diodes; Shock waves; Silicon; Time domain analysis; Transmission lines; Voltage;
Conference_Titel :
Device Research Conference Digest, 1998. 56th Annual
Conference_Location :
Charlottesville, VA, USA
Print_ISBN :
0-7803-4995-4
DOI :
10.1109/DRC.1998.731134