Title :
Noise characterization and sensitivity analysis of IC packages
Author :
Chou, Tai-Yu ; Chakrabarti, P. ; Pratapneni, S.
Author_Institution :
Adv. Package Dev., LSI Logic Corp., Fremont, CA, USA
Abstract :
Techniques of determining the performance of IC packages and sensitivity analysis of noise to package physical parameters in electronic systems are presented. Results are shown for noise characterization of various drivers on the packages and sensitivity of noise parameters to package design parameters. Using the techniques of noise characterization, package and I/O driver performance limits in the system can be evaluated. Using the techniques of sensitivity analysis, performance improvement of any changes in the package design can be predicted and the package can be optimized during the design phase to satisfy electrical requirements of the system
Keywords :
integrated circuit noise; integrated circuit packaging; sensitivity analysis; I/O drivers; IC packages; electronic systems; noise parameters; sensitivity analysis; Active noise reduction; Degradation; Electronics packaging; Integrated circuit noise; Integrated circuit packaging; Noise figure; Noise measurement; Pulse measurements; Sensitivity analysis; Voltage;
Conference_Titel :
Electronic Components and Technology Conference, 1995. Proceedings., 45th
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-2736-5
DOI :
10.1109/ECTC.1995.514363