• DocumentCode
    2353954
  • Title

    Circuit Partitioning Using Particle Swarm Optimization for Pseudo-Exhaustive Testing

  • Author

    Kumar, K. Sathish ; Bhaskar, U.P. ; Chattopadhyay, Santanu ; Mandal, Pradip

  • Author_Institution
    Dept. of Electron. & Electr. Commun. Eng., Indian Inst. of Technol. Kharagpur, Kharagpur, India
  • fYear
    2009
  • fDate
    27-28 Oct. 2009
  • Firstpage
    346
  • Lastpage
    350
  • Abstract
    Pseudo-exhaustive testing reduces the size of test set and test application time compared to exhaustive testing, by partitioning the circuit into cones with lesser number of dependency and exercising each cone with all possible input patterns. This implies that the circuit with large number of inputs should be efficiently partitioned into cones having manageable number of inputs. Partitioning problem is NP-complete and effective heuristic solutions have been proposed in the past. In this paper, we present an approach based on Particle Swarm Optimization (PSO), for circuit partitioning. PSO is based on the iterative use of a set of particles that correspond to states in an optimization problem, moving each agent in a numerical space looking for the optimal position. Experiments on combinational benchmark circuits validate the effectiveness of our work. Our approach shows an improvement of 25% over another PSO based partitioning approach published in. Over PIFAN and I-PIFAN our approach gave a maximum of 72% and 56% improvement, respectively.
  • Keywords
    circuit optimisation; combinational circuits; computational complexity; integrated circuit testing; logic partitioning; particle swarm optimisation; NP-complete problem; PIFAN; circuit partitioning; combinational benchmark circuits; digital IC; heuristic solution; particle swarm optimization; pseudoexhaustive testing; Benchmark testing; Circuit faults; Circuit testing; Combinational circuits; Communications technology; Electrical fault detection; Electronic equipment testing; Fault detection; Particle swarm optimization; Test pattern generators; Pseudo-exhaustive testing; cones; dependency; particle swarm optimization; swap operator;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advances in Recent Technologies in Communication and Computing, 2009. ARTCom '09. International Conference on
  • Conference_Location
    Kottayam, Kerala
  • Print_ISBN
    978-1-4244-5104-3
  • Electronic_ISBN
    978-0-7695-3845-7
  • Type

    conf

  • DOI
    10.1109/ARTCom.2009.145
  • Filename
    5329400