• DocumentCode
    2354
  • Title

    Electrically Stable, Solution-Processed Amorphous Oxide IZO Thin-Film Transistors Through a UV-Ozone Assisted Sol-Gel Approach

  • Author

    Singh, Thokchom Birendra ; Jasieniak, J.J. ; de Oliveira Tozi, Leonardo ; Easton, Christopher David ; Bown, Mathew

  • Author_Institution
    Mater. Sci. & Eng., CSIRO, Clayton, VIC, Australia
  • Volume
    61
  • Issue
    4
  • fYear
    2014
  • fDate
    Apr-14
  • Firstpage
    1093
  • Lastpage
    1100
  • Abstract
    Metal acetylacetonates are conventional sol-gel precursors used to deposit thin amorphous metal oxide films of In-Zn-O (IZO) suitable for thin-film field effect transistors (TFTs). In this paper, we couple this traditional approach with a postdeposition UV-ozone treatment to effectively reduce carbon impurities prior to any thermal treatment steps. Therefore, we find that the rate of bulk metal oxide formation is enhanced, thus enabling a significant reduction of the processing temperature necessary to achieve high-mobility transistors. Optimized TFT structures processed at 300 °C show n-type mobility of 35 cm2/Vs with on and off ratio of 107. Moreover, positive bias stress tests of such devices are found to exhibit one the lowest threshold voltage shifts of any solution-processed amorphous TFT fabricated without a passivation layer.
  • Keywords
    indium compounds; ozonation (materials processing); sol-gel processing; thin film transistors; InZnO; UV-ozone assisted sol-gel process; bulk metal oxide formation; carbon impurity reduction; electrically stable amorphous oxide; high mobility transistor; metal acetylacetonates; postdeposition UV-ozone treatment; solution processed amorphous oxide; temperature 300 C; thermal treatment; thin film field effect transistors; Annealing; Impurities; Logic gates; Metals; Substrates; Thin film transistors; Active matrix organic light emitting-diodes (AMOLEDs); amorphous oxide semiconductors; charge carriers mobility; high uniformity;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2014.2303796
  • Filename
    6747335