• DocumentCode
    2354126
  • Title

    Novel integration of substrate input/output vertical cavity lasers and resonant photodetectors

  • Author

    Louderback, D.A. ; Sjolund, O. ; Hegblom, E.R. ; Ko, J. ; Coldren, L.A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
  • fYear
    1998
  • fDate
    22-24 June 1998
  • Firstpage
    140
  • Lastpage
    141
  • Abstract
    We present the first monolithic integration, without regrowth, of high-performance substrate input/output vertical-cavity lasers (VCLs) and resonant photodetectors that are compatible with flip-chip bonding and integrated microlenses. Integrated arrays of these devices are critical components for very dense bi-directional free-space optical interconnects. VCLs and resonant detectors fabricated side-by-side on the same chip have the same wavelength of operation to within <0.5 nm. The VCLs exhibit very low threshold currents, as low as 174 μA, and good differential efficiencies as high as 61%. The adjacent detectors are efficient, as demonstrated by responsivities of ∼0.4 A/W, with relatively broad optical bandwidths of ∼6 nm.
  • Keywords
    flip-chip devices; integrated optoelectronics; microlenses; optical interconnections; photodetectors; semiconductor device packaging; semiconductor lasers; 174 muA; 61 percent; bi-directional free-space optical interconnects; detector responsivity; differential efficiency; flip-chip bonding; integrated device arrays; integrated microlenses; monolithic integration; operating wavelength; optical bandwidth; substrate input/output resonant photodetectors; substrate input/output vertical cavity lasers; threshold current; vertical cavity laser/resonant photodetector integration; Bidirectional control; Bonding; Lenses; Microoptics; Monolithic integrated circuits; Optical arrays; Optical interconnections; Photodetectors; Resonance; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference Digest, 1998. 56th Annual
  • Conference_Location
    Charlottesville, VA, USA
  • Print_ISBN
    0-7803-4995-4
  • Type

    conf

  • DOI
    10.1109/DRC.1998.731156
  • Filename
    731156