• DocumentCode
    2354243
  • Title

    The effect of electrical field on the slow polarization of nano-SiO/sub x/ and low-density polyethylene composite

  • Author

    li, Zhe ; Yin, Yi ; Dong, Xiaobing

  • Author_Institution
    Dept. of Electr. Eng., Shanghai Jiao Tong Univ.
  • fYear
    2006
  • fDate
    11-14 June 2006
  • Firstpage
    470
  • Lastpage
    473
  • Abstract
    The composite of nano-SiOx and low-density polyethylene is prepared with the double-solution method. Charging currents of the composite at different dc stress, as well as discharging currents, are recorded with Keithley 6517A. It is found that the curves of charging and discharging currents increase with electrical field. Transferring those charging and discharging currents from time domain into frequency domain with Fourier Transform method, it is found that the shapes of the dielectric loss spectrum vary with electrical field. At the same time, it is also found that the dielectric loss peaks increase with electrical field in frequency domain. It is believed that these phenomena have close relation with traps of the interfaces between nano-SiOx and polyethylene, as well as carriers trapping and de-trapping in those interfaces
  • Keywords
    dielectric losses; dielectric polarisation; interface states; nanocomposites; polymers; silicon compounds; Fourier Transform method; SiOx; charging currents; dielectric loss spectrum; discharging currents; double-solution method; electrical field effect; frequency domain; polarization; polyethylene composite; time domain; Dielectric losses; Dielectrics and electrical insulation; Fourier transforms; Frequency domain analysis; Material storage; Optical polarization; Polyethylene; Polymers; Resins; Stress; electrically stressing history; low-density polyethylene; nano-SiOx; nanocomposite; slow polarization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 2006. Conference Record of the 2006 IEEE International Symposium on
  • Conference_Location
    Toronto, Ont.
  • ISSN
    1089-084X
  • Print_ISBN
    1-4244-0333-2
  • Type

    conf

  • DOI
    10.1109/ELINSL.2006.1665358
  • Filename
    1665358