DocumentCode
2354250
Title
Ultra-thin and crack-free bottom leaded plastic (BLP) package design
Author
Cha, Bon ; Kim, Young-Gon ; Kang, Teck-Kyu ; Kang, Dae-Soon ; Baek, Sung-Dae
Author_Institution
Package R&D Center, Goldstar, Cheongju, South Korea
fYear
1995
fDate
21-24 May 1995
Firstpage
224
Lastpage
228
Abstract
An ultra-thin, crack-free, and bottom leaded package (BLP) has been developed. Its manufacturability and reliability have been tested for mass production purposes. The design advantage of size comes from the removal of the outer leads from the conventional lead frame configuration. Therefore, the encapsulated chip conducts electrical signals through the bottom side of the package. With the help of the this new design concept, the thickness of the package has been reduced to as little as 0.82 mm. Since the outer leads do not occupy any mounting board, the projected area of the package on the board is only 65% of conventional thin packages, such as thin-small-outline packages (TSOP). The high reliability of the package comes from the lead frame geometry and the package bottom pad locations. The reliability has been tested by the resistance to infrared (IR) reflow test conditions. No cracks were observed by visual and ultrasonic inspection as well as cross-sectional examinations
Keywords
encapsulation; integrated circuit packaging; integrated circuit reliability; lead bonding; plastic packaging; reflow soldering; 0.82 mm; bottom leaded plastic package design; crack resistance test; cross-sectional examinations; encapsulated chip; infrared reflow test resistance; lead frame geometry; manufacturability; mass production; package bottom pad locations; reliability; ultra-thin crack-free bottom leaded plastic package; ultrasonic inspection; visual inspection; Geometry; Inspection; Manufacturing; Mass production; Microelectronics; Plastic packaging; Research and development; Shape; Surface resistance; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1995. Proceedings., 45th
Conference_Location
Las Vegas, NV
Print_ISBN
0-7803-2736-5
Type
conf
DOI
10.1109/ECTC.1995.514388
Filename
514388
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