• DocumentCode
    2354560
  • Title

    High frequency 6000 V gate GTOs with buried gate structure

  • Author

    Ogura, T. ; Nakagawa, A. ; Atsuta, M. ; Kamei, Y. ; Takigami, K.

  • Author_Institution
    Toshiba Corp.
  • fYear
    1990
  • fDate
    1990
  • Firstpage
    252
  • Lastpage
    255
  • Keywords
    Anodes; Doping profiles; Frequency; Impurities; Inverters; Research and development; Switching loss; Tail; Thyristors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 1990. ISPSD '90. Proceedings of the 2nd International Symposium on
  • ISSN
    1063-6854
  • Type

    conf

  • DOI
    10.1109/ISPSD.1990.991092
  • Filename
    991092