• DocumentCode
    235466
  • Title

    Novel conductive paste using Hybrid Silver Sintering Technology for high reliability power semiconductor packaging

  • Author

    Jin, Hye-Jin ; Kanagavel, Senthil ; Wai Foo Chin

  • Author_Institution
    Alpha Adv. Mater., Alent PLC Co., Suwanee, GA, USA
  • fYear
    2014
  • fDate
    27-30 May 2014
  • Firstpage
    1790
  • Lastpage
    1795
  • Abstract
    A number of industries are developing new product-lines with innovative electronics packages that require low thermal resistance and high temperature stability, including hybrid electric vehicles, concentrator photovoltaic and wide bandgap RF amplifiers. One of the largest obstacles in the design and manufacture is the thermal management of the devices. Localized heat generation is the characteristic of the semiconductor chips used in these devices. For high power applications the thermal impedance of the die attach layer can play significant role in the thermal management and the operating temperature. Therefore, one would like to use the highest thermal conductivity and lowest thermal resistance die attach material that is capable for high volume manufacturing. In a typical electronic packaging process, chips are attached to substrates and electrically connected before they are encapsulated or sealed for protection. The attachment and electrical interconnections provide the chip with an infrastructure for the flow of electrical signals, mechanical support and heat removal. The die attach materials(1) used in the packaging of high performance power semiconductors are required to have high thermal conductivity. Lead solders, eutectic gold-tin, transient liquid phase sintering (TLPS) pastes(2) and nano-silver sintering technology(3) are typical materials used for the die attachment of power semiconductor. This paper will introduce a new die attach material using Hybrid Silver Sintering Technology (HSST).
  • Keywords
    conductive adhesives; encapsulation; microassembling; power semiconductor devices; semiconductor device packaging; semiconductor device reliability; silver; sintering; thermal conductivity; thermal management (packaging); thermal resistance; HSST; TLPS; conductive paste; device thermal management; die attach layer; electrical interconnection; encapsulation; eutectic gold-tin; high reliability power semiconductor packaging; high temperature stability; hybrid silver sintering technology; innovative electronic package; lead solder; localized heat generation; nanosilver sintering technology; power semiconductor die attachment; semiconductor chip; substrate; thermal conductivity; thermal impedance; thermal resistance; transient liquid phase sintering paste; Conductivity; Microassembly; Silicon; Silver; Temperature measurement; Thermal conductivity; Viscosity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
  • Conference_Location
    Orlando, FL
  • Type

    conf

  • DOI
    10.1109/ECTC.2014.6897541
  • Filename
    6897541