DocumentCode
235469
Title
Novel low temperature curable photo-sensitive insulator
Author
Okamoto, K. ; Mizuno, Hidenori ; Sakurai, Takayasu ; Inomata, K.
Author_Institution
Device Integration Mater. Lab., JSR Corp., Yokkaichi, Japan
fYear
2014
fDate
27-30 May 2014
Firstpage
1796
Lastpage
1802
Abstract
Currently we achived to develop new lower modulus (<;1.8GPa) materials with a small film shrinkage (<;15%), lower residual stress (<;20Mpa), and good chemical resistance at low curing temperature around 200C. These new materials provide good lithography performance at verious film thikness from 5um to 30um without deterioration of physical properties. The whole performance have been designed with new polymer concept which is containing flexible unit and crosslinking unit in polymers, and are also well-balanced to satisfy various reliability performance at thermal cycle test (TCT), PCT and high accelated stress test (HAST) conditions. For this new deisgned polymers, we hamonized our own lithography knowledge for semiconductior and pertochemical technology for polymerization technique.
Keywords
XLPE insulation; lithography; polymer insulators; polymerisation; chemical resistance; crosslinking unit; flexible unit; high accelerated stress test; lithography performance; low temperature curable photosensitive insulator; lower modulus materials; lower residual stress; polymerization technique; small film shrinkage; thermal cycle test; Chemicals; Curing; Films; Lithography; Polymers; Resistance; Rubber;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
Conference_Location
Orlando, FL
Type
conf
DOI
10.1109/ECTC.2014.6897542
Filename
6897542
Link To Document