• DocumentCode
    235469
  • Title

    Novel low temperature curable photo-sensitive insulator

  • Author

    Okamoto, K. ; Mizuno, Hidenori ; Sakurai, Takayasu ; Inomata, K.

  • Author_Institution
    Device Integration Mater. Lab., JSR Corp., Yokkaichi, Japan
  • fYear
    2014
  • fDate
    27-30 May 2014
  • Firstpage
    1796
  • Lastpage
    1802
  • Abstract
    Currently we achived to develop new lower modulus (<;1.8GPa) materials with a small film shrinkage (<;15%), lower residual stress (<;20Mpa), and good chemical resistance at low curing temperature around 200C. These new materials provide good lithography performance at verious film thikness from 5um to 30um without deterioration of physical properties. The whole performance have been designed with new polymer concept which is containing flexible unit and crosslinking unit in polymers, and are also well-balanced to satisfy various reliability performance at thermal cycle test (TCT), PCT and high accelated stress test (HAST) conditions. For this new deisgned polymers, we hamonized our own lithography knowledge for semiconductior and pertochemical technology for polymerization technique.
  • Keywords
    XLPE insulation; lithography; polymer insulators; polymerisation; chemical resistance; crosslinking unit; flexible unit; high accelerated stress test; lithography performance; low temperature curable photosensitive insulator; lower modulus materials; lower residual stress; polymerization technique; small film shrinkage; thermal cycle test; Chemicals; Curing; Films; Lithography; Polymers; Resistance; Rubber;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
  • Conference_Location
    Orlando, FL
  • Type

    conf

  • DOI
    10.1109/ECTC.2014.6897542
  • Filename
    6897542