DocumentCode :
235469
Title :
Novel low temperature curable photo-sensitive insulator
Author :
Okamoto, K. ; Mizuno, Hidenori ; Sakurai, Takayasu ; Inomata, K.
Author_Institution :
Device Integration Mater. Lab., JSR Corp., Yokkaichi, Japan
fYear :
2014
fDate :
27-30 May 2014
Firstpage :
1796
Lastpage :
1802
Abstract :
Currently we achived to develop new lower modulus (<;1.8GPa) materials with a small film shrinkage (<;15%), lower residual stress (<;20Mpa), and good chemical resistance at low curing temperature around 200C. These new materials provide good lithography performance at verious film thikness from 5um to 30um without deterioration of physical properties. The whole performance have been designed with new polymer concept which is containing flexible unit and crosslinking unit in polymers, and are also well-balanced to satisfy various reliability performance at thermal cycle test (TCT), PCT and high accelated stress test (HAST) conditions. For this new deisgned polymers, we hamonized our own lithography knowledge for semiconductior and pertochemical technology for polymerization technique.
Keywords :
XLPE insulation; lithography; polymer insulators; polymerisation; chemical resistance; crosslinking unit; flexible unit; high accelerated stress test; lithography performance; low temperature curable photosensitive insulator; lower modulus materials; lower residual stress; polymerization technique; small film shrinkage; thermal cycle test; Chemicals; Curing; Films; Lithography; Polymers; Resistance; Rubber;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
Conference_Location :
Orlando, FL
Type :
conf
DOI :
10.1109/ECTC.2014.6897542
Filename :
6897542
Link To Document :
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