Title :
A heterogeneous CMOS-CNT architecture utilizing novel coding of boolean functions
Author :
Singh, Ashish ; Zeineddine, Hady Ali ; Aziz, Adnan ; Vishwanath, Sriram ; Orshansky, Michael
Author_Institution :
Univ. of Texas at Austin, Austin
Abstract :
We address the challenge of implementing reliable computation of Boolean functions in future nanocircuit fabrics. Such fabrics are projected to have very high defect rates. We overcome this limitation by using a combination of cheap but unreliable nanodevices and reliable but expensive CMOS devices. The contribution of this work is twofold - (1) A heterogeneous architecture suitable for low level defect tolerance (2) A novel coding strategy that for the first time exploited the structure of Boolean function for better coder. In our approach, defect tolerance is achieved through a novel coding of Boolean functions; specifically, we exploit the don´t cares of Boolean functions encountered in multi-level Boolean logic networks for constructing better codes. The optimal coding problem is NP-hard. We solved it with a SAT based heuristic. We show that compared to direct application of existing coding techniques, the coding overhead in terms of extra bits can be reduced, on average by 23%, and savings can go up to 34%. We demonstrate that by incorporating efficient coding techniques more than a 20% average yield improvement is possible in case of 10% defect rates. We incur a negligible delay penalty of less than 1% for decoder and the area is 13X smaller compared 22 nm CMOS technology and 32% smaller than TMR (triple modular redundancy) coding scheme.
Keywords :
Boolean functions; CMOS logic circuits; carbon nanotubes; computability; computational complexity; encoding; nanoelectronics; nanotube devices; Boolean functions; NP-hard problem; decoder; expensive CMOS devices; heterogeneous CMOS-CNT architecture; low level defect tolerance; multilevel Boolean logic networks; nanocircuit fabrics; optimal coding problem; size 22 nm; triple modular redundancy coding scheme; unreliable nanodevices; Boolean functions; CMOS technology; Circuit faults; Computer architecture; Fabrics; Integrated circuit reliability; Integrated circuit technology; Nanoscale devices; Reconfigurable logic; Redundancy;
Conference_Titel :
Nanoscale Architectures, 2007. NANOSARCH 2007. IEEE International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-1791-9
Electronic_ISBN :
978-1-4244-1791-9
DOI :
10.1109/NANOARCH.2007.4400852