• DocumentCode
    2355199
  • Title

    Fundamentals for the compounding of nanocomposites to enhance electrical insulation performance

  • Author

    Calebrese, Christopher ; Le Hui ; Schadler, Linda S. ; Nelson, J. Keith

  • Author_Institution
    Rensselaer Polytech. Inst., Troy, NY, USA
  • fYear
    2010
  • fDate
    23-27 May 2010
  • Firstpage
    38
  • Lastpage
    41
  • Abstract
    Although it is undeniable that the promise of enhanced dielectric properties through the use of nanotechnology has generated worldwide interest in nanodielectrics in the last decade, study of the experimental literature indicates that there are numerous inconsistencies in the results obtained. In many instances, it is likely that this is due to a lack of quality control during the formulation of this new class of material. By examining several nanocomposite examples, this contribution seeks to shed some light on the likely causes for these inconsistencies. Through the paramount property of dielectric strength, it is confirmed that poor dispersion and/or agglomeration is often the cause of poor material performance. Examples are provided to show how this can be rectified through the use of particle functionalization and compatibilizers, the use of shear in compounding, and the careful control of moisture. However, good dispersion alone is not sufficient since some of the techniques used may also lead to microcavity formation and other undesirable phenomena. The optimization of nanocomposite compounding is intimately connected with the need to quantify the resulting structure. Consequently, the paper includes a brief discussion of the part played by thermogravimetric and thermal analyses as well as the use of the focused ion beam method to supplement scanning electron microscopy as a viable alternative to (the more difficult) transmission electron microscopy for the evaluation of dispersion and percolation.
  • Keywords
    dielectric materials; dielectric properties; focused ion beam technology; insulator testing; moisture control; nanocomposites; nanotechnology; quality control; scanning electron microscopy; thermal analysis; transmission electron microscopy; dielectric properties; dispersion evaluation; electrical insulation; focused ion beam method; microcavity formation; moisture control; nanocomposites compounding; nanodielectrics; nanotechnology; percolation evaluation; quality control; scanning electron microscopy; thermal analyses; thermogravimetric; transmission electron microscopy; Dielectrics; Dispersion; Electric breakdown; Nanocomposites; Nanoparticles; Plastics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Modulator and High Voltage Conference (IPMHVC), 2010 IEEE International
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    978-1-4244-7131-7
  • Type

    conf

  • DOI
    10.1109/IPMHVC.2010.5958290
  • Filename
    5958290