DocumentCode :
2355217
Title :
Reliable 808-nm high power laser diodes
Author :
Pawlik, Susanne ; Müller, Jürgen ; Lichtenstein, Norbert ; Jaeggi, Dominik ; Schmidt, Berthold
Author_Institution :
Bookham AG, Zurich, Switzerland
fYear :
2004
fDate :
25-25 Sept. 2004
Firstpage :
79
Lastpage :
80
Abstract :
A reliable 808-nm single mode laser diodes with a low divergent beam and high light output power is demonstrated. The device is found to be applicable for longitudinal pumping of Nd-doped solid state lasers.
Keywords :
laser beams; laser reliability; laser transitions; life testing; semiconductor device testing; semiconductor lasers; 808 nm; high power laser diodes; longitudinal pumping; low divergent beam; reliability; Diode lasers; Heat sinks; Laser modes; Optical arrays; Optical design; Power generation; Power lasers; Semiconductor laser arrays; Solid lasers; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Laser Conference, 2004. Conference Digest. 2004 IEEE 19th International
Conference_Location :
Matsue-shi
Print_ISBN :
0-7803-8627-2
Type :
conf
DOI :
10.1109/ISLC.2004.1382764
Filename :
1382764
Link To Document :
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