Title :
Failure mechanisms of polyimide and perfluoroalkoxy films under high frequency pulses
Author :
Yin, Weijun ; Tao, Fengfeng ; Zhao, Junwei ; Chen, George ; Schweickart, Daniel
Author_Institution :
GE Global Res. Center, Niskayuna, NY, USA
Abstract :
Breakdown behaviors of polyimide and perfluoroalkoxy high temperature films under unipolar and bipolar repetitive pulses are investigated. A bipolar 20 kV, 20 kHz pulse generator with fast dV/dt pulse risetime has been designed and built to study the impact of pulse frequency, pulse rise time, and pulse polarity and pulse duty cycles on breakdown strength of these films films. Space charge injection and decay processes are also investigated. Possible failure mechanisms are discussed.
Keywords :
charge injection; electric breakdown; failure analysis; polymer films; pulse generators; space charge; breakdown behaviors; breakdown strength; decay processes; failure mechanisms; frequency 20 kHz; high frequency pulses; perfluoroalkoxy high temperature films; polyimide films; pulse duty cycles; pulse generator; pulse polarity; pulse rise time; space charge injection; unipolar repetitive pulses; voltage 20 kV; Electric breakdown; Electrodes; Films; Insulation; Polyimides; Space charge; Voltage measurement;
Conference_Titel :
Power Modulator and High Voltage Conference (IPMHVC), 2010 IEEE International
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-7131-7
DOI :
10.1109/IPMHVC.2010.5958292
