Title :
Extraction of /spl epsiv/(f) and tan /spl delta/(f) for BT insulator up to 30 GHz using the short-pulse propagation technique
Author :
Deutsch, A. ; Winkel, T.-M. ; Kopcsay, G.V. ; Surovic, C.W. ; Rubin, B.J. ; Katopis, G.A. ; Chamberlin, B.J.
Author_Institution :
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
The self-consistent frequency-dependent dielectric constant, /spl epsiv//sub r/(f), and dielectric loss, tan/spl delta/(f), are determined over the range 2 to 30 GHz using a short-pulse propagation technique and an iterative extraction based on a rational function expansion. Simulations of signal propagation on printed circuit board wiring using transmission-line models based on these results show very good agreement with measured step and pulse time-domain excitations.
Keywords :
dielectric loss measurement; interconnections; iterative methods; microwave measurement; permittivity measurement; printed circuits; pulse measurement; rational functions; step response; transmission line theory; 2 to 30 GHz; BT insulator; bismaleimide triazine; dielectric loss; epoxy-resin; interconnection modeling; iterative extraction; printed circuit board wiring; pulse time-domain excitation; rational function expansion; self-consistent frequency-dependent dielectric constant; short-pulse propagation technique; step-domain excitation; transmission-line models; Circuit simulation; Dielectric constant; Dielectric losses; Dielectrics and electrical insulation; Frequency; Printed circuits; Propagation losses; Pulse measurements; Transmission lines; Wiring;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2003
Conference_Location :
Princeton, NJ, USA
Print_ISBN :
0-7803-8128-9
DOI :
10.1109/EPEP.2003.1250039
