Understanding common-mode noise on wide data-buses

Author

Deutsch, Alina ; Smith, Howard H. ; Kopcsay, Gerard V. ; Krauter, Byron L. ; Surovic, Christopher W. ; Elfadel, Abe ; Widiger, David J.

Author_Institution

Res. Div., IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA

fYear

2003

fDate

27-29 Oct. 2003

Firstpage

309

Lastpage

312

Abstract

This paper discusses the effects of the frequency-dependent losses in the reference return path for wide, on-chip data buses, that must be understood in order to accurately predict the interaction and summation of crosstalk and common-mode noise signals. This interaction can generate excessive noise for on-chip global interconnections. Measured and simulated results are shown for representative 8-12 line couplings and circuit-synthesis techniques are shown to capture the correct R(f)L(f)C behavior of the reference series impedance.

Keywords

circuit simulation; crosstalk; integrated circuit interconnections; integrated circuit noise; microprocessor chips; system buses; circuit-synthesis; common-mode noise; crosstalk interaction; frequency-dependent losses; microprocessor chip; on-chip data buses; on-chip global interconnections; reference return path; reference series impedance; Circuit noise; Circuit simulation; Clocks; Crosstalk; Delay; Frequency; Impedance; Integrated circuit interconnections; Propagation losses; Wiring;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Performance of Electronic Packaging, 2003

Conference_Location

Princeton, NJ, USA

Print_ISBN

0-7803-8128-9

Type

conf

DOI

10.1109/EPEP.2003.1250056

Filename

1250056