• DocumentCode
    2355759
  • Title

    An efficient pre-layout on-chip inductance noise modeling tool for bus design

  • Author

    Mazumder, Mohiuddin ; Bohnke, Ronald ; Husain, Asim ; Grannes, Dean ; Chiprout, Eli ; Sun, Lei ; Menon, Satish ; Eells, Jarod ; Dai, Changhong

  • Author_Institution
    Technol. CAD, Santa Clara, CA, USA
  • fYear
    2003
  • fDate
    27-29 Oct. 2003
  • Firstpage
    317
  • Lastpage
    320
  • Abstract
    On-chip inductance noise is becoming an increasingly important part of the total noise, particularly for global on-chip interconnects, because of faster transistor speeds and higher drive currents. An efficient pre-layout tool has been developed for accurate analysis of high frequency inductance effects on bus design. Since the return loop for inductance is not known a priori, a novel technique has been developed for fast determination of the inductance extraction window size to include all significant couplings and a sufficient number of power/ground return conductors. In addition, an algorithm has been developed for worst-case vector generation to estimate worst-case peak noise. The tool includes a methodology to determine the impact of power supply noise on bus crosstalk noise. It integrates RLC extraction, netlist generation, automatic worst-case vector generation, transient simulation, optimization, and post-processing of the simulated results to calculate noise, delay, and other signal integrity metrics. We demonstrate its application on optimal bus design by a microprocessor design group.
  • Keywords
    RLC circuits; circuit CAD; circuit optimisation; circuit simulation; crosstalk; inductance; integrated circuit modelling; microprocessor chips; system buses; RLC extraction; bus crosstalk noise; bus design; efficient pre-layout tool; global on-chip interconnects; high frequency inductance effects; inductance noise modeling tool; microprocessor design; netlist generation; on-chip inductance noise; optimization; power supply noise; signal integrity metrics; transient simulation; worst-case peak noise; worst-case vector generation; Circuit noise; Circuit simulation; Conductors; Design automation; Driver circuits; Frequency; Inductance; Noise figure; Noise generators; RLC circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 2003
  • Conference_Location
    Princeton, NJ, USA
  • Print_ISBN
    0-7803-8128-9
  • Type

    conf

  • DOI
    10.1109/EPEP.2003.1250058
  • Filename
    1250058