DocumentCode
235583
Title
Electrical-thermal characterization of wires in packages
Author
Kai Liu ; Frye, Robert ; HyunTai Kim ; YongTaek Lee ; Gwang Kim ; Park, Soojin ; Ahn, B.
Author_Institution
STATS ChipPAC, Tempe, AZ, USA
fYear
2014
fDate
27-30 May 2014
Firstpage
2027
Lastpage
2034
Abstract
The electrical-thermal co-simulation approaches, for wires-in-air and wires-in-package, are developed by the coupling between their electrical and thermal properties, using ADS (Agilent Design System) Symbolically-Defined Devices (SDD) models for multiple wire segments. Key parameters for these simulation models are then derived from experimental results. These experimentally validated (or assisted) simulation models can be used to predict electrical-thermal behavior of bond wires in situations of interest, and to develop design guidelines for reliable operation. Test boards with wires-in-air were made, and fusing currents on wires of different materials (Au, Cu, Ag), lengths, and diameters were measured and compared with published data. Some QFN package testers having wires in different materials(Au, Cu, Ag), lengths, and different diameters, with mold material were also made to characterize the wires in real package environment. Simulation and experiment data, as well as some failure-analysis (FA) data through X-ray and SEM methods, are presented in the paper.
Keywords
copper; electronics packaging; failure analysis; gold; lead bonding; scanning electron microscopy; silver; ADS SDD models; Ag; Au; Cu; QFN package testers; SEM methods; X-ray methods; agilent design system symbolically-defined devices models; bond wires; electrical-thermal behavior; electrical-thermal cosimulation approaches; failure-analysis data; multiple wire segments; test boards; wires-in-air; wires-in-package; Equations; Mathematical model; Resistance; Resistance heating; Temperature measurement; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
Conference_Location
Orlando, FL
Type
conf
DOI
10.1109/ECTC.2014.6897581
Filename
6897581
Link To Document