Title :
Non desituctive measurements for analyzing power semiconductor devices
Author :
Palmer, P.H. ; Johnson, C.M.
Author_Institution :
Cambridge University
Keywords :
Anodes; Cathodes; Circuit testing; Coils; Magnetic field measurement; Power measurement; Power semiconductor devices; Production; Semiconductor device measurement; Temperature measurement;
Conference_Titel :
Power Semiconductor Devices and ICs, 1992. ISPSD '92. Proceedings of the 4th International Symposium on
DOI :
10.1109/ISPSD.1992.991229
