Title :
Statistical approach to the EMI modeling of large ASICs by a single noise-current source
Author :
Antonini, G. ; Drewniak, J.L. ; Leone, M. ; Orlandi, A. ; Ricchiuti, V.
Author_Institution :
Dept. of Electr. Eng., L´´Aquila Univ., Italy
Abstract :
Large and complex ASICs are source of propagating noise inside the powerbus planes. A lumped noise source model is proposed and validated by means of a statistics based method.
Keywords :
application specific integrated circuits; electromagnetic interference; frequency response; integrated circuit modelling; integrated circuit noise; EMI modeling; cavity-resonator model; fast transient current; frequency response; large complex ASIC; lumped noise source model; power supplying pins; powerbus planes; propagating noise; single noise-current source; statistics based method; Application specific integrated circuits; Dielectric losses; Electromagnetic interference; Electromagnetic transients; Integrated circuit noise; Noise generators; Pins; Power supplies; Switching circuits; System-on-a-chip;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2003
Conference_Location :
Princeton, NJ, USA
Print_ISBN :
0-7803-8128-9
DOI :
10.1109/EPEP.2003.1250065
