• DocumentCode
    235598
  • Title

    New materials and novel applications for CMP

  • Author

    Rhoades, Robert L.

  • Author_Institution
    Entrepix, Inc., Phoenix, AZ, USA
  • fYear
    2014
  • fDate
    19-21 Nov. 2014
  • Firstpage
    105
  • Lastpage
    108
  • Abstract
    CMP is well established as the best known process for planarization and smoothing of many materials used in electronic device manufacturing. In recent years, additional materials and new applications have evolved that leverage the unique capabilities of CMP. However, many of these applications also involve significant technical challenges for process and integration teams. This paper discusses some of the techniques used to achieve required CMP results. Several examples of the proposed approach will also be shared which include planarization of a polymer layer and final polish of a SiGe surface after direct wafer bond and splitting (similar to silicon-on-insulator substrates).
  • Keywords
    chemical mechanical polishing; electron device manufacture; planarisation; polymers; wafer bonding; CMP; SiGe; chemical mechanical polishing; direct wafer bond; electronic device manufacturing; material smoothing; polymer layer planarization; Optimization; Planarization; Polymers; Slurries; Surface topography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Planarization/CMP Technology (ICPT), 2014 International Conference on
  • Conference_Location
    Kobe
  • Print_ISBN
    978-1-4799-5556-5
  • Type

    conf

  • DOI
    10.1109/ICPT.2014.7017257
  • Filename
    7017257