DocumentCode :
235598
Title :
New materials and novel applications for CMP
Author :
Rhoades, Robert L.
Author_Institution :
Entrepix, Inc., Phoenix, AZ, USA
fYear :
2014
fDate :
19-21 Nov. 2014
Firstpage :
105
Lastpage :
108
Abstract :
CMP is well established as the best known process for planarization and smoothing of many materials used in electronic device manufacturing. In recent years, additional materials and new applications have evolved that leverage the unique capabilities of CMP. However, many of these applications also involve significant technical challenges for process and integration teams. This paper discusses some of the techniques used to achieve required CMP results. Several examples of the proposed approach will also be shared which include planarization of a polymer layer and final polish of a SiGe surface after direct wafer bond and splitting (similar to silicon-on-insulator substrates).
Keywords :
chemical mechanical polishing; electron device manufacture; planarisation; polymers; wafer bonding; CMP; SiGe; chemical mechanical polishing; direct wafer bond; electronic device manufacturing; material smoothing; polymer layer planarization; Optimization; Planarization; Polymers; Slurries; Surface topography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Planarization/CMP Technology (ICPT), 2014 International Conference on
Conference_Location :
Kobe
Print_ISBN :
978-1-4799-5556-5
Type :
conf
DOI :
10.1109/ICPT.2014.7017257
Filename :
7017257
Link To Document :
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