Title :
A versatile linkage device for high-voltage ICs
Author :
Bodensohn, A. ; Korec, J. ; Silber, D.
Author_Institution :
Daimler-Benz Res.Inst.
Keywords :
Circuit simulation; Circuit testing; Couplings; Diodes; Integrated circuit measurements; Integrated circuit testing; Power supplies; Silicon; Substrates; Voltage control;
Conference_Titel :
Power Semiconductor Devices and ICs, 1992. ISPSD '92. Proceedings of the 4th International Symposium on
DOI :
10.1109/ISPSD.1992.991235
