Title :
Proceedings. 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Abstract :
The following topics are dealt with: yield and defects; optoelectronics; fault analysis, injection and simulation; test and diagnosis; current test and diagnosis; test generation and application; scan design and test; BIST; error correcting codes; analogue and mixed signal test; defect tolerance and testing; FPGA and memory test; design verification and synthesis; SoC and core test; system reliability; fault tolerance; soft errors.
Keywords :
VLSI; built-in self test; error correction codes; fault diagnosis; fault tolerance; field programmable gate arrays; integrated circuit reliability; integrated circuit testing; integrated circuit yield; mixed analogue-digital integrated circuits; BIST; FPGA; SoC; VLSI systems; analogue signal test; core test; defect tolerance; design verification; error correcting codes; fault analysis; fault diagnosis; fault injection; fault tolerance; memory test; mixed signal test; optoelectronics; scan design; simulation; soft errors; system reliability; test generation; testing; yield; Error correction coding; Fault diagnosis; Field programmable gate arrays; Integrated circuit reliability; Integrated circuit testing; Mixed analog-digital integrated circuits; Self-testing; Very-large-scale integration; Yield estimation;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7695-2042-1
DOI :
10.1109/DFTVS.2003.1250088
