• DocumentCode
    2356078
  • Title

    On minimizing testing rounds for fault identification

  • Author

    Schmeichel, E. ; Hakimi, S.L. ; Otsuka, M. ; Sullivan, G.

  • Author_Institution
    Dept. of Math. & Comput. Sci., San Jose State Univ., CA, USA
  • fYear
    1988
  • fDate
    27-30 June 1988
  • Firstpage
    266
  • Lastpage
    271
  • Abstract
    A bound is obtained for the number of rounds of testing sufficient to identify the faulty units of a system. Within a single round each unit may participate in at most one test. The authors give an adaptive algorithm which works in O(log/sub (n/t)//sup t/) rounds and uses O(n) tests. The multiplicative constants in the new bounds are small; four in both cases. This is a major improvement over previous nonadaptive and adaptive algorithm which required O(t+log n) rounds of testing and O(n+t) tests. If t>n/sup 1- epsilon /, then the algorithm runs within a constant number of rounds.<>
  • Keywords
    minimisation; multiprocessing systems; parallel algorithms; adaptive algorithm; fault identification; multiprocessing systems; testing rounds minimisation; Adaptive algorithm; Computer science; Electrostatic precipitators; Fault diagnosis; Mathematics; Nose; Parallel algorithms; Performance evaluation; Reliability engineering; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fault-Tolerant Computing, 1988. FTCS-18, Digest of Papers., Eighteenth International Symposium on
  • Conference_Location
    Tokyo, Japan
  • Print_ISBN
    0-8186-0867-6
  • Type

    conf

  • DOI
    10.1109/FTCS.1988.5330
  • Filename
    5330