DocumentCode :
2356191
Title :
Yield modeling and analysis of a clockless asynchronous wave pipeline with pulse faults
Author :
Feng, T. ; Park, N. ; Kim, Y.B. ; Piuri, V.
Author_Institution :
Dept. of Comput. Sci., Oklahoma State Univ., Stillwater, OK, USA
fYear :
2003
fDate :
3-5 Nov. 2003
Firstpage :
34
Lastpage :
41
Abstract :
This paper proposes a new fault model and its modeling and analysis methods in a clockless asynchronous wave pipeline for extensive yield evaluation and assurance. It is highly desirable to have an adequate and specific pulse fault rate model for establishing a sound theoretical foundation for clockless wave pipeline design for reliability. The pulse fault model is thoroughly identified as the unique fault specifically in the clockless wave pipeline in comparison with conventional wave and wave delay faults. The pulse fault rate is statistically yet practically modeled, and extensively evaluated with respect to various design parameters, such as yield, fault coverage, defect-level, and request level length. An extensive numerical simulation is conducted to demonstrate the effect of the proposed pulse fault on the yield.
Keywords :
failure analysis; fault simulation; integrated circuit layout; integrated circuit modelling; integrated circuit reliability; integrated circuit yield; microprocessor chips; numerical analysis; pipeline processing; statistical analysis; clockless asynchronous wave pipeline; clockless wave pipeline design; defect-level; design for reliability; design parameters; fault coverage; fault model; microprocessors; numerical simulation; pulse fault rate model; pulse faults; request level length; statistically modeled pulse fault rate; wave delay faults; wave pipeline technology; yield evaluation; yield modeling; Algorithm design and analysis; Clocks; Fault diagnosis; Fault tolerance; Logic; Pipelines; Reliability theory; Switches; Synchronization; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on
ISSN :
1550-5774
Print_ISBN :
0-7695-2042-1
Type :
conf
DOI :
10.1109/DFTVS.2003.1250093
Filename :
1250093
Link To Document :
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