Title :
4.5 kV GTO turn-off failure analysis under an inductive load including snubber, gate circuit and various parasitics
Author :
Omura, Ichiro ; Nakagawa, Akio
Author_Institution :
Toshiba Corp.
Keywords :
Anodes; Circuit simulation; Coupling circuits; Equations; Failure analysis; Impact ionization; Inductance; Reactive power; Snubbers; Thyristors;
Conference_Titel :
Power Semiconductor Devices and ICs, 1992. ISPSD '92. Proceedings of the 4th International Symposium on
DOI :
10.1109/ISPSD.1992.991246
