Title :
Failure prediction of power devices under reverse surge current conditions
Author :
Freydin, Boris ; Velmre, Enn ; Udal, Andres
Author_Institution :
Silvaco Intemational
Keywords :
Charge carrier processes; Doping; Electronic packaging thermal management; Nonlinear equations; Poisson equations; Semiconductor device packaging; Semiconductor devices; Semiconductor diodes; Surges; Temperature dependence;
Conference_Titel :
Power Semiconductor Devices and ICs, 1992. ISPSD '92. Proceedings of the 4th International Symposium on
DOI :
10.1109/ISPSD.1992.991247
