• DocumentCode
    2356240
  • Title

    Failure prediction of power devices under reverse surge current conditions

  • Author

    Freydin, Boris ; Velmre, Enn ; Udal, Andres

  • Author_Institution
    Silvaco Intemational
  • fYear
    1992
  • fDate
    1992
  • Firstpage
    118
  • Lastpage
    123
  • Keywords
    Charge carrier processes; Doping; Electronic packaging thermal management; Nonlinear equations; Poisson equations; Semiconductor device packaging; Semiconductor devices; Semiconductor diodes; Surges; Temperature dependence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 1992. ISPSD '92. Proceedings of the 4th International Symposium on
  • Type

    conf

  • DOI
    10.1109/ISPSD.1992.991247
  • Filename
    991247
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2356240