DocumentCode :
235625
Title :
Study on a novel CMP/P-CVM fusion processing system (Type B) and its basic characteristics
Author :
Oyama, Koki ; Doi, Toshiro K. ; Sano, Yousuke ; Kurokawa, Satoru ; Aida, Hideo ; Miyashita, Tadakazu ; Seongwoo Kim ; Yamazaki, Tsutomu ; Nishizawa, Hideakli
Author_Institution :
NJC Inst. Technol., Namiki Precision jewel Co. Ltd., Tokyo, Japan
fYear :
2014
fDate :
19-21 Nov. 2014
Firstpage :
142
Lastpage :
146
Abstract :
In this study, we are aiming to establish a high-efficiency, high-quality polishing process of the hard-to-process materials. Recently high-grade semiconductor substrates are made by various processing methods. CMP (Chemical Mechanical Polishing) is a main processing method to planarize a substrate. On the other hand, P-CVM is a superior processing method which does not damage the substrate surface. To achieve high-efficiency, high-quality processing, we designed an innovative fusion CMP/P-CVM processing machine and produced it experimentally. Through investigation of a fundamental property of the CMP/P-CVM fusion processing machine, we confirmed increase in removal rate and reduction of the surface roughness by the synergistic effects.
Keywords :
chemical mechanical polishing; planarisation; chemical mechanical polishing method; hard-to-process materials; high-efficiency high-quality polishing process; high-grade semiconductor substrates; removal rate; substrate surface; surface roughness reduction; type B CMP-P-CVM fusion processing system; Diamonds; Rough surfaces; Silicon carbide; Substrates; Surface roughness; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Planarization/CMP Technology (ICPT), 2014 International Conference on
Conference_Location :
Kobe
Print_ISBN :
978-1-4799-5556-5
Type :
conf
DOI :
10.1109/ICPT.2014.7017266
Filename :
7017266
Link To Document :
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