DocumentCode :
2356268
Title :
Some considerations to the design of NB snubber
Author :
Li, Ge ; Wang, Haitian ; Cao, Liang
Author_Institution :
Inst. of Plasma Phys., Chinese Acad. of Sci., Hefei, China
fYear :
2010
fDate :
23-27 May 2010
Firstpage :
266
Lastpage :
270
Abstract :
Snubber is often used as functional passive protection device to be inserted between the ion source and its acceleration power supply for arc quenching purpose. Fink, Baker and Owren developed related design method by neglecting the inductance effects of the core snubber and assuming that the snubber core never saturates, which gives the analysis solution to the design of core snubber. The Fink-Baker method used the assumption that the eddy current resistance is about 2.5 times its logic derived one which is an empirical design method and verified in their snubber tests in Lawrence Berkeley Laboratory. This method is further used in the design of DIIID 100kV snubber. Due to that the inductance does exist in the equivalent circuit of the core snubber, its effects and its design rules are discussed further. Some experimental evaluations have been done to verify the analysis results, which could be used for detail design of core snubbers.
Keywords :
algebra; eddy currents; snubbers; DIIID snubber; Fink-Baker method; Lawrence Berkeley Laboratory; NB snubber design; arc quenching; eddy current resistance; functional passive protection device; inductance effects; ion source; power supply; snubber core; snubber tests; voltage 100 kV; Design methodology; Inductance; Magnetic devices; Magnetoelectric effects; Materials; Mathematical model; Snubbers; Ampere´ law; Analytical computation method; Arc current; Core Snubber; Equivalent circuit; Experimental Advanced Superconducting Tokamak (EAST); International Thermonuclear Experimental Reactor (ITER); Magnetic Confinement Fusion (MCF); NBI; Neutral beams; accelerator; eddy current; passive protection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Modulator and High Voltage Conference (IPMHVC), 2010 IEEE International
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-7131-7
Type :
conf
DOI :
10.1109/IPMHVC.2010.5958344
Filename :
5958344
Link To Document :
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