3DSDM: A 3 data-source diagnostic method

Author

Hariri, Y. ; Thibeault, C.

Author_Institution

Electr. Eng. Dept., Ecole de technologie superieure, Montreal, Que., Canada

fYear

2003

fDate

3-5 Nov. 2003

Firstpage

117

Lastpage

123

Abstract

The goal of this paper is to present a diagnosis method for bridging faults combining three different data sources: I_DDQ measurements, logical behavior and layout parasitic capacitances. The resulting hybrid method constitutes a significant improvement over an existing one based on probabilistic signatures. Combining these data contributes to reduce the number of potential fault sites to consider in the diagnosis process, and therefore accelerate this process. Simulation results show that the number of potential bridging fault sites is reduced from 0.5N(N-1) to less than N, where N is the number of nodes in the circuit under test.

Keywords

capacitance; circuit simulation; failure analysis; fault diagnosis; integrated circuit testing; integrated circuit yield; leakage currents; probability; 3DSDM; I_DDQ measurements; bridging fault diagnosis method; circuit nodes; circuit under test; data sources; hybrid method; layout parasitic capacitances; logical behavior; potential bridging fault sites; probabilistic signatures; simulation; three-data-source diagnostic method; Bridge circuits; Capacitance measurement; Circuit faults; Circuit testing; Data mining; Electric variables measurement; Failure analysis; Fault diagnosis; Histograms; Parasitic capacitance;

fLanguage

English

Publisher

ieee

Conference_Titel

Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on

ISSN

1550-5774

Print_ISBN

0-7695-2042-1

Type

conf

DOI

10.1109/DFTVS.2003.1250102

Filename

1250102