Title :
Electrothermal simulation of an IGBT
Author :
Axelrad, V. ; Klein, R.
Author_Institution :
Technology Modeling Associates
Keywords :
Circuit simulation; Electrothermal effects; Heat sinks; Insulated gate bipolar transistors; Lattices; MOSFET circuits; Medical simulation; Poisson equations; Temperature; Thermal resistance;
Conference_Titel :
Power Semiconductor Devices and ICs, 1992. ISPSD '92. Proceedings of the 4th International Symposium on
DOI :
10.1109/ISPSD.1992.991254
