DocumentCode
2356379
Title
On-chip new current sensing technology with high accuracy using field effect resistance for intelligent power MOSFETs
Author
Tokura, Norihito ; Yamamoto, Tsuyoshi ; Hara, Kunihiko
Author_Institution
Nippondenso Co., Ltd.
fYear
1992
fDate
1992
Firstpage
160
Lastpage
161
Keywords
Circuit testing; Electric resistance; Electric variables; Electrodes; MOSFETs; Resistors; Temperature dependence; Temperature distribution; Temperature sensors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Semiconductor Devices and ICs, 1992. ISPSD '92. Proceedings of the 4th International Symposium on
Type
conf
DOI
10.1109/ISPSD.1992.991255
Filename
991255
Link To Document