Title :
On-chip new current sensing technology with high accuracy using field effect resistance for intelligent power MOSFETs
Author :
Tokura, Norihito ; Yamamoto, Tsuyoshi ; Hara, Kunihiko
Author_Institution :
Nippondenso Co., Ltd.
Keywords :
Circuit testing; Electric resistance; Electric variables; Electrodes; MOSFETs; Resistors; Temperature dependence; Temperature distribution; Temperature sensors; Voltage;
Conference_Titel :
Power Semiconductor Devices and ICs, 1992. ISPSD '92. Proceedings of the 4th International Symposium on
DOI :
10.1109/ISPSD.1992.991255
