Title :
CROWNE: current ratio outliers with neighbor estimator
Author :
Sabade, Sagar S. ; Walker, D.M.H.
Author_Institution :
Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
Abstract :
Increased leakage and process variations make distinction between fault-free and faulty chips by IDDQ test difficult. Earlier, the concept of current ratios (CR) was proposed to screen defective (outlier) chips. However, it is not capable of catching certain defects. Neighboring chips on a wafer have similar fault-free parameters that are correlated through the underlying fabrication process. Based on this observation, an alternative test metric called neighbor current ratio (NCR) was proposed. NCR screens outlier chips based on their nonconformance to local variation in IDDQ. In this paper, we explore the correlation between different vectors that yield CR and NCR values. The effectiveness of NCR along with additional test parameters to screen outlier chips is evaluated using industrial test data.
Keywords :
failure analysis; fault location; integrated circuit reliability; integrated circuit testing; integrated circuit yield; leakage currents; production testing; CROWNE; IDDQ test; NCR; current ratio outliers with neighbor estimator; current ratios; defective outlier chip screening; fabrication process; fault-free chips; fault-free parameters; faulty chips; industrial test data; leakage current; neighbor current ratio test metric; neighboring chips; outlier chip local IDDQ variation nonconformance; process variations; test parameters; vector correlation; Chromium; Computer science; Fabrication; Face detection; Geometry; Leak detection; Leakage current; Probability distribution; Reliability engineering; Testing;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on
Print_ISBN :
0-7695-2042-1
DOI :
10.1109/DFTVS.2003.1250104
