DocumentCode :
2356570
Title :
Scan-based BIST diagnosis using an embedded processor
Author :
Balakrishnan, Kedarnath J. ; Touba, Nur A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
fYear :
2003
fDate :
3-5 Nov. 2003
Firstpage :
209
Lastpage :
216
Abstract :
For system-on-chip designs that contain an embedded processor, this paper present a software based diagnosis scheme that can make use of the processor to aid in diagnosis in a scan-based built-in self-test (BIST) environment. The diagnosis scheme can be used to determine both the scan cells that capture errors as well as the failing test vectors during a BIST session, thereby allowing a faster and more precise diagnosis. The BIST session needs to be run only once for diagnosis. The scheme is based on pseudo-random linear compaction of the output response bits. The proposed scheme uses word-based linear operations that can be implemented very fast and efficiently on the embedded processor. Experimental results indicate that the proposed scheme is very powerful in identifying the failing test vectors and performs better than previous methods both in terms of the suspect set size and the accuracy of diagnosis.
Keywords :
boundary scan testing; built-in self test; embedded systems; failure analysis; logic testing; system-on-chip; SoC; built-in self-test; embedded processor; error capturing scan cells; failing test vectors; failure analysis; fault diagnosis; output response bits pseudo-random linear compaction; scan-based BIST; software based diagnosis scheme; system-on-chip; word based linear operations; Built-in self-test; Compaction; Design engineering; Embedded computing; Embedded software; Fault diagnosis; Performance evaluation; System-on-a-chip; Testing; Vectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on
ISSN :
1550-5774
Print_ISBN :
0-7695-2042-1
Type :
conf
DOI :
10.1109/DFTVS.2003.1250114
Filename :
1250114
Link To Document :
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