• DocumentCode
    2356579
  • Title

    Efficient Threshold Architectures with Bounded Fan-Ins for Exclusive-ORs

  • Author

    Feng Shi ; Zhiyuan Yan ; Wagh, Meghanad

  • Author_Institution
    Dept. of ECE, Lehigh Univ., Bethlehem, PA, USA
  • fYear
    2012
  • fDate
    17-19 Oct. 2012
  • Firstpage
    131
  • Lastpage
    136
  • Abstract
    As process technologies scale into nanometer region, new opportunities as well as challenges arise. Some emerging nanotechnology devices that are promising candidates to replace the CMOS technology are particularly suitable for threshold logic implementations. While most conventional Boolean gates, including AND, OR, NOT, NAND, and NOR, can be implemented by a single threshold gate, exclusive-OR (XOR) is an important exception. This represents a significant obstacle, since XORs are essential building blocks for all finite field arithmetic operations over GF(2m), which in turn are used in various applications. In this paper, we propose efficient architectures with finite fan-ins for XORs based on threshold gates, and our architectures greatly outperform architectures obtained by first expressing an XOR based on other Boolean gates and then using their threshold logic implementations. Our work in this paper is novel in two aspects. First, in addition to two-input XORs, we also investigate multi-input XORs, because they are suitable for threshold logic implementation and are very instrumental in finite field arithmetic operations. Second, our architectures differ from previous implementations of XORs based on threshold logic in that our architectures assume bounded fan-in, which is critical to the reliability to nanotechnology devices.
  • Keywords
    Boolean functions; CMOS logic circuits; digital arithmetic; integrated circuit reliability; logic gates; nanoelectronics; threshold logic; Boolean gate; CMOS technology; GF; XOR gate; bounded fan-ins; exclusive-OR gate; finite fan-ins; finite field arithmetic operation; multiinput XOR; nanometer region; nanotechnology device; process technology; reliability; threshold architecture; threshold gate; threshold logic implementation; CMOS integrated circuits; Complexity theory; Computer architecture; Hardware; Logic gates; Nanotechnology; Vegetation; Nanotechnology; finite field; threshold logic;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing Systems (SiPS), 2012 IEEE Workshop on
  • Conference_Location
    Quebec City, QC
  • ISSN
    2162-3562
  • Print_ISBN
    978-1-4673-2986-6
  • Type

    conf

  • DOI
    10.1109/SiPS.2012.27
  • Filename
    6363195