• DocumentCode
    2356820
  • Title

    Fault tolerant multi-layer neural networks with GA training

  • Author

    Sugawara, Eiko ; Fukushi, Masaru ; Horiguchi, Susumu

  • Author_Institution
    Graduate Sch. of Inf. Sci., JAIST, Ishikawa, Japan
  • fYear
    2003
  • fDate
    3-5 Nov. 2003
  • Firstpage
    328
  • Lastpage
    335
  • Abstract
    This paper addresses a fault tolerant architecture of multi-layer neural networks with a genetic algorithm scheme. For large scale neural networks, implemented in a single chip or silicon wafer, it is necessary to develop self-recovery mechanisms that can automatically recover faults without a host computer. In this paper, we propose fault tolerant multi-layer neural networks employing both hardware redundancy and weight retraining in order to realise self-recovering neural networks. The main advantages of our architecture are low hardware cost for adding redundant neurons and fast training by a genetic algorithm implemented in hardware. A prototype system is implemented on a field programmable gate array to show the possibility of self-recovering neural networks.
  • Keywords
    fault tolerance; field programmable gate arrays; genetic algorithms; learning (artificial intelligence); neural nets; redundancy; system recovery; FPGA; GA training; fault tolerance; fault tolerant neural networks; genetic algorithms; hardware redundancy; multilayer neural networks; redundant neurons; self-recovering neural networks; self-recovery mechanisms; weight retraining; Computer architecture; Computer networks; Fault tolerance; Genetic algorithms; Large-scale systems; Multi-layer neural network; Neural network hardware; Neural networks; Redundancy; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-2042-1
  • Type

    conf

  • DOI
    10.1109/DFTVS.2003.1250128
  • Filename
    1250128