DocumentCode :
2356906
Title :
Spectrum of fast electrons in subnanosecond breakdown of air-filled diodes at atmospheric pressure
Author :
Baksht, E.H. ; Kostyrya, I.D. ; Tarasenko, V.F. ; Burachenko, A.G. ; Kozhevnikov, V.Yu. ; Kozyrev, A.V.
Author_Institution :
Inst. of High Current Electron., SB RAS, Tomsk, Russia
fYear :
2010
fDate :
23-27 May 2010
Firstpage :
405
Lastpage :
408
Abstract :
The spectra of electron beams produced in air-filled diodes at atmospheric pressure were studied. The feasibility of correct reconstruction of the electron beam spectrum from an experimental dependence of its attenuation factor in foils of different thickness was demonstrated. The electron energy distributions were calculated on minimum a priori assumptions by regularization of an ill-posed problem (a Fredholm integral equation. The spectra of a subnanosecond electron beam generated in the gas gap during the voltage pulse rise time were reconstructed and analyzed. A time-of-flight spectrometer study and reconstruction of the spectrum from the data on e-beam attenuation confirmed the fact that groups of electrons with two-three characteristic energies can be generated in gas-filled diodes. In experiments, electrons of energy greater than that corresponding to the nominal voltage amplitude across the gap were detected.
Keywords :
Fredholm integral equations; atmospheric pressure; diodes; electron beams; electron spectra; thick films; time of flight spectrometers; air-filled diode; atmospheric pressure; electron energy distribution; foils attenuation factor; gas gap; gas-filled diode; ill-posed problem; minimum a priori assumption; subnanosecond breakdown; subnanosecond electron beam spectrum reconstruction; time-of-flight spectrometer; voltage pulse rise time; Anodes; Approximation methods; Attenuation; Cathodes; Discharges; Electron beams; Integral equations; Electron beam; energy distribution function; pulsed gas discharge;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Modulator and High Voltage Conference (IPMHVC), 2010 IEEE International
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-7131-7
Type :
conf
DOI :
10.1109/IPMHVC.2010.5958380
Filename :
5958380
Link To Document :
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